<p>🎤 <strong>Presenter</strong>: Christopher Freye (Los Alamos National Laboratory)</p><p>💾 <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/labrulez-bucket-strapi-h3hsga3/O_1_Freye_10783a9cf3.pdf"><strong>PDF presentation</strong></a></p><h3><strong>Abstract</strong></h3><p><strong>Two-dimensional gas chromatography (</strong><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library?instrumentationItems=2"><strong>GC×GC</strong></a><strong>) when coupled with mass spectrometry (MS) especially high-resolution mass spectrometry (HRMS) provides the ideal technique to discover minute chemical changes. However, GC×GC analyses result in extremely large datasets (GBs of information) wherein the statistically significant chemical changes are buried within the background chemical matrix. To combat these issues, many chemometric techniques have been developed or applied. Recently we introduced a new chemometric technique for GC-MS termed alteration analysis (ALA) and two-dimensional correlation (2DCOR) which can be used to discover statistically significant chemical changes across a series of chromatograms and understand the relationship between the statistically relevant changes. ALA generates three sets of information, the basic alteration map (BAM) which is the magnitude of the change, the synchronous alteration map (SAM) which describes the linear change, and the asynchronous alteration map (AAM) which describes the non-linear change. 2DCOR can then be used to understand the relationship between the chemical changes but 2DCOR can also resolve the sequence of the changes. A workflow for GC×GC-MS will be demonstrated. Special attention will be given to what differentiates the GC×GC work flow from GC for both the ALA and 2DCOR.</strong></p><h3><strong>Video Transcription</strong></h3><p>The presentation focuses on how <strong>advanced mathematical and chemometric methods</strong> can be used to extract meaningful information from <strong>highly complex chromatographic data</strong>, especially in <strong>multidimensional chromatography coupled with mass spectrometry (GC×GC-MS, LC-MS)</strong>.</p><h4><strong>Why traditional data analysis falls short</strong></h4><p>Modern multidimensional chromatography generates <strong>extremely large datasets</strong>, often containing <strong>billions of data points</strong>. Visual inspection, peak tables, or classical identification-based workflows are impractical—especially when:</p><ul><li>Samples are highly complex (e.g. petroleum, metabolomics, high explosives)</li><li>Most compounds are <strong>unknown unknowns</strong></li><li>The key question is not <i>what</i> the compounds are, but <strong>whether samples differ and how</strong></li></ul><p>Program managers and decision-makers are primarily interested in <strong>detecting statistically significant changes</strong>, not exhaustive compound identification.</p><h4><strong>Introduction of Alteration Analysis (ALA)</strong></h4><p>To address subtle, trend-based changes across series of chromatograms, the speaker introduces <strong>Alteration Analysis (ALA)</strong>, a chemometric approach adapted from spectroscopy and applied to chromatography.</p><p>ALA quantitatively evaluates how <strong>individual data points change across multiple samples</strong>, allowing detection of:</p><ul><li>Extremely subtle trends</li><li>Overlapping peaks</li><li>Changes hidden in noise or baseline interference</li></ul><p>Key ALA outputs include:</p><ul><li><strong>BAM (Basic Alteration Map):</strong> magnitude of change</li><li><strong>SAM (Systematic Alteration Map):</strong> linear changes</li><li><strong>AM (Alteration Map):</strong> nonlinear changes</li></ul><p>Even changes as small as <strong>1% per sample</strong> can be detected reliably, including peaks that are heavily overlapped.</p><h4><strong>Beyond detection: understanding relationships with 2D Correlation</strong></h4><p>Once statistically significant changes are identified, <strong>two-dimensional correlation analysis (2D-COR)</strong> is used to understand <strong>relationships between changing compounds</strong>, including:</p><ul><li>Whether compounds are correlated or anti-correlated</li><li>The <strong>sequence of changes over time</strong> (which changes happen first)</li></ul><p>This is especially critical for <strong>degradation and aging studies</strong>, where intermediate species may appear and disappear before the final state—information that traditional methods like Fisher ratio or PCA often miss.</p><h4><strong>Solving GC×GC challenges with tiling</strong></h4><p>GC×GC data introduces additional challenges due to:</p><ul><li>Peak misalignment</li><li>Exponential data growth during correlation calculations</li></ul><p>The presenter explains how <strong>tile-based approaches</strong> reduce data dimensionality, overcome alignment issues, and make ALA and 2D correlation computationally feasible—even for massive GC×GC-MS datasets.</p><h4><strong>Real-world application: explosive aging studies</strong></h4><p>The methodology was applied to <strong>aging and decomposition of high explosives</strong>, where:</p><ul><li>Over <strong>250 chemical changes</strong> were identified</li><li>Many intermediate species would have been missed using traditional comparisons</li><li>ALA combined with 2D correlation enabled reconstruction of <strong>degradation pathways</strong></li><li>The most significant change was <strong>not necessarily the first change</strong>, a critical insight for risk assessment and stability studies</li></ul><h4><strong>Key takeaway</strong></h4><p>By combining <strong>Alteration Analysis and 2D correlation</strong>, the approach:</p><ul><li>Detects statistically guaranteed chemical changes</li><li>Handles subtle, overlapped, and noisy signals</li><li>Determines <strong>magnitude, type, interrelationships, and order of changes</strong></li><li>Shifts chromatographic data analysis from identification-driven to <strong>decision-driven</strong></li></ul><p>This math-driven workflow enables faster, more reliable interpretation of complex chromatographic datasets and provides actionable insights for applications such as <strong>explosive aging, pharmaceutical degradation, and complex mixture analysis</strong>.</p><blockquote><p><strong>This text has been automatically transcribed from a video presentation using AI technology. It may contain inaccuracies and is not guaranteed to be 100% correct.</strong></p></blockquote>

Discovery analysis for GCxGC trends using alteration and 2D correlation (Chris Freye, MDCW 2026)

<p><strong>Our Library never stops expanding. What are the most recent contributions to LabRulezGCMS Library in the week of 9th February 2026? Check out new documents from the field of the gas phase, especially GC and GC/MS techniques!</strong></p><blockquote><p><span style="font-size:20px;">👉 </span><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library"><span style="font-size:20px;"><strong>SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT GCMS AND RELATED TECHNIQUES</strong></span></a></p></blockquote><blockquote><p><strong>👉 Need info about different analytical techniques?</strong> Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library"><strong>LabRulezLCMS</strong></a> or <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library"><strong>LabRulezICPMS</strong></a> libraries.</p></blockquote><p>This week we bring you technical note by <strong>Agilent Technologies, </strong>presentation by<strong> MDCW / University of Copenhagen </strong>and<strong> </strong>application notes by<strong> Shimadzu </strong>and<strong> Thermo Fisher Scientific!</strong></p><h3><strong>1. Agilent Technologies: What Causes Spots on </strong><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library?instrumentationItems=19&amp;manufacturerItems=1&amp;search=PLOT"><strong>PLOT Columns</strong></a><strong>? Will It Affect the Performance of the Column?</strong></h3><ul><li>Technical note</li><li><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/labrulez-bucket-strapi-h3hsga3/te_what_causes_spots_plot_columns_affecting_performance_5994_8775en_agilent_3b7180512a.pdf"><strong>Full PDF for download</strong></a></li></ul><p>Spots on porous layer open tubular (PLOT) columns are caused by small voids in the stationary phase coating inside the tube. These spots are areas where there is an uneven coating or lack of phase. It is normal to find some voids in the phase coating of PLOT columns. The stationary phase in PLOT columns is an opaque, solid, and porous material. In many Agilent PLOT columns such as the GS-Alumina phases, molecular sieves, porous polymers (Q and U), and the GS-OxyPLOT, the stationary phase is visible as a white powder. For many PLOT columns, the stationary phase fill solution is a viscous suspension of particles that are less than 10 microns in diameter. The phase is coated using a dynamic process in which a plug of fill solution is pushed through the tubing, and the plug’s speed and viscosity determines the thickness of the stationary phase layer. Once the PLOT’s stationary phase is deposited, it is held in place by electrostatic charge, chemical interactions between particles, and/or binding agents. In wall‑coated open tubular (WCOT) columns, stationary phases such as polysiloxanes or polyethylene glycols are immobilized by chemical bonding to the glass surface and cross-linking between polymer strands. Because this type of bonding and cross‑linking is not possible with PLOT phases, the result is a stationary phase layer that is both fundamentally different and inherently less stable in PLOT columns than in WCOT&nbsp;columns.</p><h3><strong>2. MDCW / University of Copenhagen: One-shot tensor decomposition of full-scale GC×GC-VUV datasets for resolving petrochemical groups</strong></h3><ul><li>Presentation</li><li><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/labrulez-bucket-strapi-h3hsga3/O_17_Schneide_67c8ff7866.pdf"><strong>Full PDF for download</strong></a></li></ul><p>The presentation introduces a novel <strong>all-samples-at-once, shift-invariant tri-linear tensor decomposition approach</strong> for the analysis of full-scale <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library?search=GC%C3%97GC-VUV"><strong>GC×GC-VUV</strong></a><strong> datasets</strong>, aimed at resolving and quantifying petrochemical groups. Traditional template-based or pixel-based methods struggle with retention-time shifts and co-eluting compounds, often requiring manual intervention and prior chemical knowledge. The proposed approach leverages the intrinsic low-rank structure of GC×GC-VUV data to enable robust, automated group-level analysis across multiple samples simultaneously.</p><p>At the core of the method is a <strong>shift-invariant tri-linear model</strong>, conceptually related to PARAFAC and multivariate curve resolution, but extended using frequency-domain (FFT-based) modeling to explicitly account for chromatographic peak shifts. By decomposing the entire dataset in one step, the model provides <strong>accurate estimates of peak landscapes, VUV spectra, and relative peak areas</strong>, while remaining agnostic to retention-time variability. Importantly, the approach requires only a small number of tunable parameters, making it practical for routine use.</p><p>The method was demonstrated on a <strong>case study involving 14 petrochemical gas-oil samples</strong>, including straight-run, hydrotreated, hydroconverted, coker, and light cycle oils. Extracted VUV spectra showed excellent agreement with reference spectra from a VUV spectral database, enabling confident assignment of components to chemical groups such as saturates, olefins, and mono- to poly-aromatics. Quantitative results exhibited <strong>high repeatability (RSD typically 3–9%)</strong> and strong correlation with established template-based reference methods.</p><p>Overall, the work demonstrates that <strong>one-shot, shift-invariant tensor decomposition</strong> provides a powerful and scalable alternative to conventional GC×GC data-analysis strategies. By combining chemical interpretability, robustness to chromatographic shifts, and strong quantitative performance, the approach opens new opportunities for automated, high-confidence group-level analysis of complex petrochemical samples and beyond.</p><h3><strong>3. Shimadzu: Py-Screener Ver. 3: Simultaneously Test for Substances Regulated Under RoHS, TSCA, and POPs</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_00949_en_4754e50164.pdf"><strong>Full PDF for download</strong></a></li></ul><h5><strong>User Benefits</strong></h5><ul><li>In just one analysis, <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library?manufacturerItems=3&amp;search=Py-Screener"><strong>Py-Screener</strong></a> Ver. 3 can determine levels of phthalate esters, brominated flame retardants (PBBs, PBDEs), PIP (3:1), UV-328, dechlorane plus (DP), short-chain chlorinated paraffins (SCCPs), and medium-chain chlorinated paraffins (MCCPs).&nbsp;</li><li>It can also test for SCCPs and MCCPs by electron ionization (EI) instead of negative chemical ionization (NCI).&nbsp;</li><li>PIP (3:1), UV-328, DP, and SCCPs and MCCPs can be screened without the need for corresponding reference materials.</li></ul><p>Countries and regulatory bodies worldwide are introducing increasingly stringent regulations on the chemical substances used in electronic devices and industrial products. The RoHS Directive and REACH regulations in the EU, the Toxic Substances Control Act (TSCA) in the USA, and the Stockholm Convention on Persistent Organic Pollutants (POPs) are also targeting an increasingly broad range of substances. Therefore, manufacturers are required to accurately identify regulated substances in their products and comply with each regulation. While Py-Screener Ver. 2 can screen for seven phthalate esters and brominated flame retardants, including substances regulated under the RoHS Directive, version 3 can also screen for PIP (3:1), which is regulated under the TSCA, as well as UV328, DP, and SCCPs and MCCPs , which are regulated under the Stockholm Convention on POPs. A list of supported substances isshown in Table 1. This article introduces the simultaneous analysis of multiple regulated substances and a case study of testing specific regulated substances in samples, using Py-Screener Ver. 3.</p><h4><strong>Analysis Process</strong></h4><p>Py-Screener Ver. 3 can determine levels of phthalate esters and brominated flame retardants contained in products in accordance with the international analytical standards IEC62321-8 and IEC62321-3-3. It can also test for specific regulated substances (Table 1) under the same conditions and in the same analysis. In this test, background intensity and instrument sensitivity (S/N) were verified before analyzing samples. These parameters are prescribed by IEC62321-8 to ensure the accuracy of the methods used. Background intensity and instrument sensitivity were determined using a reference material (PN: 225-31003- 91) *1 that consisted of a plastic sheet that was spiked with seven phthalate esters. The results met the criteria for both parameters.</p><p>The testing workflow is shown in Fig. 1. Before testing samples, calibration curves were prepared by analyzing the 1000 mg/kg phthalate ester reference material and polypropylene spiked with brominated flame retardants (ERM-EC591). A hole puncher was used to punch out two discs at a time of the phthalate ester reference material, and a cutter was used to obtain pieces of the other materials. Each material was weighed in a sample cup for analysis. During the analysis of samples, phthalate esters and some of the regulated brominated flame retardants were quantitated using a one-point calibration curve. The remaining brominated flame retardants and specific regulated substances were quantitated using the correction factor database*2 that is included with Py-Screener Ver. 3.</p><h4><strong>Conclusion</strong></h4><p>Py-Screener Ver. 3 successfully determined in samples the concentrations of the regulated substances PIP (3:1), UV-328, DP, and SCCPs and MCCPs. Normally, SCCP and MCCP levels are tested using NCI, but Py-Screener Ver. 3 uses EI. This enables it to test for not only SCCPs and MCCPs but also phthalate esters, brominated flame retardants, and other regulated substances in just one analysis. In addition, by using the relative correction factors linked to DEHP in the phthalate ester reference material, the levels of these regulated substances were determined without the need for the corresponding reference materials. Py-Screener Ver. 3 can also create a screening program that addresses substance restrictions under the RoHS Directive, the US TSCA, and the POPs Convention.</p><h3><strong>4. Thermo Fisher Scientific: Improving low carbon steel production in specialty steel processes</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/labrulez-bucket-strapi-h3hsga3/prima_pro_process_mass_spectrometer_an1626_7fc840235f.pdf"><strong>Full PDF for download</strong></a></li></ul><p>World crude steel production reached 1,691 million tonnes in 2017, up by 5.3% compared to 2016.1 While much of this capacity is still produced in primary steel processes such as basic oxygen furnaces and electric arc furnaces, the need for refined steel with greater durability and resistance to heat and corrosion has led to the increased use of vacuum degassing processes, such as VOD and RH, in secondary steel production. These processes are able to achieve ultra-low levels of residual carbon, while at the same time retaining desired levels of other alloy materials. If these processes are to achieve the required level of steel product quality, they need fast, continuous gas analysis of the furnace exhaust gas. Without accurate information on the composition of the gas leaving the furnace, any variations in the decarburization process are only detected after the event, resulting in the production of out-of-specification steel.</p><h4><strong>Advantages of mass spectrometry&nbsp;</strong></h4><p>Traditional Non-Dispersive Infra-Red (NDIR) analyzers are used in many conventional steelmaking processes to measure CO and CO<sub>2</sub> , but they can only sample at atmospheric pressure. In vacuum steelmaking the process pressure changes dramatically, typically from atmospheric pressure down to less than 1 mbar, over the 20-30 minutes of the melt. So NDIR analyzers have to sample some distance downstream from the process. Analytical data is updated several minutes after the gas leaves the melt and the control system is forced to operate on historic rather than real-time data.&nbsp;</p><p>Paramagnetic analyzers can be used to measure O<sub>2</sub> , while thermal conductivity analyzers can be used to measure H<sub>2</sub> . These analyzers also suffer from slow response, while the need to operate three different types of analyzers adds to the plant maintenance burden. Moreover, the three analyzers cannot analyze inert gases, so N<sub>2</sub> is calculated by difference, a result that suffers from the sum of the errors of the three analytical techniques.&nbsp;</p><p>Mass spectrometry operates at high vacuum so it is ideal for monitoring vacuum processes. It is also able to monitor all seven components in Table 1 in seconds rather than minutes, ensuring the plant control model is frequently updated with accurate compositional data.</p><h4><strong>Precision of analysis&nbsp;</strong></h4><p>At the heart of the <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library?manufacturerItems=2&amp;search=Prima+PRO+Mass+Spectrometer"><strong>Thermo Scientific™ Prima PRO Mass Spectrometer</strong></a> (MS) is a magnetic sector analyzer which offers unrivalled precision and accuracy compared with other mass spectrometers. Thermo Fisher Scientific manufactures both quadrupole and magnetic sector mass spectrometers; over thirty years of industrial experience have shown the magnetic sector based analyzer offers the best performance for industrial on-line gas analysis.&nbsp;</p><p>Key advantages of magnetic sector analyzers include improved precision, accuracy, long intervals between calibrations, and resistance to contamination. Typically, analytical precision is between 2 and 10 times better than a quadrupole analyzer, depending on the gases analyzed and complexity of the mixture.&nbsp;</p><p>A unique feature of the Prima PRO magnet is that it is laminated. Its analysis times are similar to a quadrupole analyzer, offering the unique combination of rapid analysis and high stability. This allows the rapid and extremely stable analysis of an unlimited number of user-defined gases. The scanning magnetic sector is controlled with 24-bit precision using a magnetic flux measuring device for extremely stable mass alignment.&nbsp;</p><p>The ion source is an enclosed type for high sensitivity, minimum background interference, and maximum contamination resistance. This is a high-energy (1000 eV) analyzer that offers extremely rugged performance in the presence of gases and vapors that have the potential for contaminating the analyzer. Typical performance specifications for the Prima PRO MS are shown in Table 1. Analytical performance is demonstrated by analyzing the calibration bottle over 1 hour following calibration, with an analysis time of just 6 seconds. Standard deviations measured on the calibration cylinder will be equal to or better than the stated values.</p>

News from LabRulezGCMS Library - Week 07, 2026

<p><strong>Although modern agriculture needs to be based on accurate real-time data on soil, plant, and environmental conditions, affordable, sufficiently sensitive, and robust monitoring devices for this purpose are currently missing. According to scientists, low-cost sensors based on new smart materials and printing technologies offer a suitable solution. The results of multidisciplinary research thus far and proposals for the development of these devices have been presented by researchers from Czechia, Great Britain, Spain, and the USA in a review article in the prestigious journal </strong><a target="_blank" rel="noopener noreferrer" href="https://www.nature.com/articles/s41467-026-68778-6#Abs1"><i><strong>Nature Communications</strong></i></a><strong>.</strong></p><p>“<i>Sensor technologies for monitoring plant health are still in their infancy. Only simple sensors capable of monitoring basic parameters such as pH, soil moisture, or temperature are commonly available on the market. However, if farmers are to face current challenges, including climate change, and ensure sufficient food for humanity, they need much more effective tools that will enable them to monitor, for example, various pathogens, including bacteria and fungi. In our opinion, a suitable solution is a combination of new smart materials and printing for the production of inexpensive, durable, and scalable materials</i>,” said the article’s first author, <strong>David Panáček</strong> from CATRIN, who worked on the study during his internship at Imperial College London.</p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CATRIN_Soucasne_senzory_nestaci_Vedci_navrhuji_novou_cestu_ke_sledovani_zdravi_rostlin_b4014952a3.jpg" alt="CATRIN: David Panáček" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CATRIN_Soucasne_senzory_nestaci_Vedci_navrhuji_novou_cestu_ke_sledovani_zdravi_rostlin_b4014952a3.jpg 208w," sizes="100vw" width="1536" height="1152"></p><p>Sensors for monitoring plant health, for example, lag behind similar devices used in human medicine. According to the authors, advances in materials science, which will enable the development of scalable sensor technologies, play a key role in this potential shift. “<i>Printing techniques, including inkjet printing, screen printing, aerosol printing, 3D printing, and direct laser writing, offer flexible ways to produce flexible sensors, large-area sensors, and sensors integrated directly into plants. The review article summarizes recent advances in printable low-dimensional materials for agricultural sensors, analyzes their physico-chemical properties in relation to sensor performance, and discusses key challenges and future opportunities requiring interdisciplinary integration</i>,” said one of the corresponding authors, <strong>Michal Otyepka</strong>.</p><p>The research brought together materials scientists, chemists, biologists, sensing experts, and printing technology specialists. Materials research and the use of graphene-based smart materials were led by scientists from CATRIN at Palacký University and VŠB-Technical University of Ostrava. Plant biologists from CATRIN contributed their knowledge of plant development, their responses to stress conditions, and the monitoring of their properties. Researchers from Imperial College London took care of the electronics, while representatives from<a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/companies/36"><strong> CEITEC – VUT</strong></a> focused on printing technologies. The team also included leading experts in sensing from the Catalan Institute of Nanoscience and Nanotechnology in Barcelona, and Joseph Wang of the University of California San Diego, the “father of sensing and electrochemistry,” also contributed his extensive knowledge.</p><p>“<i>This is a groundbreaking study on this topic, which has managed to attract some truly big names in their respective fields. Last but not least, the study demonstrates that interdisciplinarity at CATRIN gives rise to completely new and promising research topics, such as plant sensing and its use for studying plant-environment interactions and smart agriculture,</i>” added another corresponding author, <strong>Nuria De Diego</strong>.</p>

Current sensors are not good enough. Scientists propose a new way to monitor plant health

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Science and research

The Multidimensional Chromatography (MDC) Workshop draws experts in this exciting field to share and discuss their research.

The Multidimensional Chromatography Workshop

The Czech Advanced Technology and Research Institute (CATRIN) at Palacký University is a cutting-edge scientific hub dedicated to advancing research in the fields of nanotechnology, biotechnology, and biomedicine. At its core, CATRIN boasts outstanding scientific teams, featuring international researchers. We emphasize interdisciplinarity, foster global collaborations, and work to translate our research findings into practical applications.

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Agilent Technologies

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<p><strong>Are you working in an analytical lab and looking for an easy and reliable FT-IR instrument for your daily work? How can you save costs in the long term, higher efficiency and reduce workload? Bruker understands you need and provides instruments with unique features that help you stand out from the crowd.</strong></p><p>FT-IR technique is an indispensable analytical tool in most chemical labs, analytical centers and quality control departments. FT-IR spectroscopy is an ease to use and non-destructive analytical method for verification, identification or quantification. To face the daily challenges arising from high sample amount, unknown materials and multiple (maybe unexperienced) users, you need a highly flexible FT-IR spectrometer with user-friendly automation and outstanding performance.</p><p>Bruker cares about your need and presents you the INVENIO spectrometer platform to make your daily work easy and convenient. In the free-of-charge webinar we will focus on the difficulties in analytical labs and explain which features of INVENIO can help in such situations.</p>

INVENIO for Analytical Centers

In the free-of-charge webinar we will focus on the difficulties in analytical labs and explain which features of INVENIO can help in such situations.

<div><p><strong>Does your research involve the identification and quantification of gases?&nbsp; This webinar will focus on how Fourier-Transform Infrared (FTIR) spectroscopy is utiliztexed using different hardware and software approaches to identify the composition of complex gas mixtures with a thorough discussion of the following topics:</strong></p><ul><li>Mixture analysis using library search</li><li>TGA-IR at reduced pressure&nbsp;</li><li>Spectra manipulation method for deconvoluting complex spectra (mixtures)</li></ul><p>Examples of applications will include the identification of plasticizers in polymers, PVC undercoating analysis, decomposition of&nbsp; PETN explosive, NHF propellant, and others.</p></div>

Bruker: Identification and Quantification of Gases with FT-IR

Identification and Quantification of Gases with FT-IR

This webinar explores how FT-IR spectroscopy, with various hardware and software approaches, is used to identify the composition of complex gas mixtures.

<p><strong>Struggling with those pesky software roadblocks that break your workflow? Join our technical show-and-tell software series where we tackle the most frequently asked (and frustrating) software questions. From retention time locking, PCDLs, AMDIS libraries, retention indices, and deconvolution, our experts will decode the chaos with insights and examples. Whether you’re feeling like a pro or just trying to keep your system running, questions always arise. This event is your chance to get real answers.</strong></p><p><strong>What you will learn:</strong></p><ul><li>When to use retention time locking</li><li>How to set up retention time locking&nbsp;</li></ul><blockquote><p><strong>Presenter:&nbsp;</strong>Erinn O'Neill (GC/MS Applications Scientist, Agilent)</p><p>Erinn O’Neill is a GC/MS presales application scientist for Agilent in Wilmington, Delaware. She graduated from the University of North Carolina at Chapel Hill with a PhD in chemistry in 2019, where she focused on identifying novel chemical structures synthesized by plant-pathogenic bacteria. Before that, she obtained a Bachelor’s degree in chemistry from Drew University in New Jersey, where she studied reactions between atmospheric aerosol surrogates and trace pollutants.</p></blockquote>

Agilent Technologies: Ctrl+Alt+Del Your Software Struggles - Technical Show-and-Tell Sessions

Understand Retention Time Locking

Join this webinar and learn when to use retention time locking and how to set up retention time locking.

<p><strong>Struggling with those pesky software roadblocks that break your workflow? Join our technical show-and-tell software series where we tackle the most frequently asked (and frustrating) software questions. From retention time locking, PCDLs, AMDIS libraries, retention indices, and deconvolution, our experts will decode the chaos with insights and examples. Whether you’re feeling like a pro or just trying to keep your system running, questions always arise. This event is your chance to get real answers.</strong></p><p><strong>What you will learn:</strong></p><ul><li>The process of stepping through Optimizer software to build MRM's</li><li>How to optimize collision energies for your system when you have an existing MRM method &nbsp;&nbsp;</li></ul><blockquote><p><strong>Presenter:&nbsp;</strong>Erinn O'Neill (GC/MS Applications Scientist, Agilent)</p><p>Erinn O’Neill is a GC/MS presales application scientist for Agilent in Wilmington, Delaware. She graduated from the University of North Carolina at Chapel Hill with a PhD in chemistry in 2019, where she focused on identifying novel chemical structures synthesized by plant-pathogenic bacteria. Before that, she obtained a Bachelor’s degree in chemistry from Drew University in New Jersey, where she studied reactions between atmospheric aerosol surrogates and trace pollutants.</p></blockquote>

Use Optimizer to Build MRM Transitions and Fine Tune Your QQQ Method

Join this webinar and learn the process of stepping through Optimizer software to build MRM's.

Use Optimizer to Build MRM Transitions and Tune QQQ Method

<p><strong>The interest in complete microplastics solutions is tremendous, but many analytical labs shun the initial investment in time, money and labor to establish a well-running standard procedure.</strong></p><p><strong>In this webinar, our microplastic application specialist Dr. Marten Seeba will show you:</strong></p><ul><li>Demands and requirements to establish a microplastic lab based on FT-IR technology</li><li>Necessary steps in sample preparation from various sources</li><li>Theoretical basics to understand the idea behind FT-IR analysis of microparticles</li><li>That there are wholesome, complete solutions to microplastic analysis, right out of the box</li></ul><div><div><div><div><div><p><strong>You will learn about:</strong></p><ul><li>Instrumental setup and experimentals</li><li>Particle analysis and evaluation</li><li>Microplastic software solutions</li></ul><p><strong>We will cover the basics of:</strong></p><ul><li>Sample types</li><li>Sample preparation steps</li><li>FT-IR experimental procedures</li><li>FT-IR instrumentation</li></ul></div></div></div></div></div><div><div><div><div><div><p><strong>Who should attend:</strong></p><ul><li>Analytical service laboratories</li><li>Environmental researchers</li><li>Food &amp; Feed producers</li><li>Drinks &amp; Beverages producers</li></ul><blockquote><p><strong>Presenter: </strong>Dr. Marten Seeba</p><p>Dr. Marten Seeba graduated in chemistry from the University of Göttingen before joining Bruker as an application expert for FT-IR and IR laser microscopy. He is a point of contact for our customers and as such has gained a great deal of expertise in many applications such as microplastics, pharmaceuticals, tissue analysis and materials science.</p></blockquote></div></div></div></div></div>

Bruker: Getting your lab ready for microplastic analysis by FT-IR spectroscopy

Getting your lab ready for microplastic analysis by FT-IR spectroscopy

Learn how to set up an FT-IR microplastic lab, including key requirements, sample preparation steps, analysis principles, and ready-to-use solution options.

Preparing Your Lab for Microplastic Analysis via FT-IR

<p><strong>LUMOS II ushers in a new era in FT-IR Microscopy.</strong></p><blockquote><p><strong>Presenter: &nbsp;</strong>Dr. Tom Tague (Applications Manager and Chair of the Safety Committee Bruker Corporation)</p><div><p>Dr. Tom Tague is the Applications Manager (FTIR and Raman products) and Chair of the Safety Committee for Bruker Corporation. He is also a member of the Visiting Advisory Committee of the Metropolitan Museum of Art in New York and the Advisory Board of Amplified Sciences. Dr. Tague received his Ph.D. from the University of Utah in Physical Chemistry and his B.S. in Chemistry, from the University of Texas at San Antonio. He conducted his postdoctoral research at the University of Virginia working with professor Lester Andrews. He is a member of the American Chemical Society, the Society for Applied Spectroscopy, the American Physical Society, and the Optical Society of America. Dr. Tague is active in developing new methods and instrumentation with the goal of improving the sensitivity and detection limits of spectroscopy related applications. Dr. Tague has more than 80 publications and 5 patents.</p></div></blockquote>

Bruker: The State-of-the-Art in Infrared Microscopy

The State-of-the-Art in Infrared Microscopy

LUMOS II ushers in a new era in FT-IR Microscopy.

<p><strong>In an emission experimental setup, the sample itself acts as light source of the spectrometer and may emit light in various scenarios, e.g.: thermal emission, photoluminescence or the characterization of self-made lasers and other emission devices. Therefore, emission spectroscopy is established in versatile application fields in academia as well as in industrial applied research &amp; development or failure analysis.</strong></p><p>Bruker provides innovative instrumental solutions for emission spectroscopy with a broad palette of research spectrometers, dedicated measurement modules and accessories. In a series of customer webinars, we will explain the basic principles and give application examples as well as practical handling hints for emission spectroscopy.</p><div><div><div><div><blockquote><h5><strong>Part 1: General Setup of Emission Experiments and Determination of Emissivity.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/6908255056900555277"><strong>Watch Recording of Part 1&nbsp;</strong></a></a></p></blockquote><div><blockquote><h5><strong>Part 2: Photoluminescence (PL) Experiments: Challenges and the Suitable Instrumental Solutions.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/216857088501568015"><strong>Watch Recording of Part 2&nbsp;</strong></a></a></p></blockquote><div><blockquote><h5><strong>Part 3: Step Scan as a Powerful Tool for Emission Experiments and Source Characterization.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/6306834291730245889">W<strong>atch Recording of Part 3&nbsp;</strong></a></a></p></blockquote></div></div></div></div></div></div>

FTIR Emission Spectroscopy

We will explain the basic principles and give application examples as well as practical handling hints for emission spectroscopy.

<div><p><strong>This webinar introduces scattering scanning nearfield optical microscopy (s-SNOM), which provides&nbsp;information about the complex optical properties of the nanoscale region of a sample under a metallized tip that nanofocuses optical radiation. Recent developments in novel methods, advanced light sources, and refined instrumentation have made s-SNOM more valuable and accessible.</strong></p><p>Capabilities for s-SNOM are available on Bruker’s <a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/anasys-nanoir3-s.html">nanoIR3-s</a> and <a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/anasys-nanoir3-s-broadband.html">nanoIR3-s Broadband</a> platforms, and the technique itself was developed in collaboration with the webinar’s guest speaker, Professor Markus Raschke, Dept. of Physics/JILA, University of Colorado.</p><p>After a thorough and illustrative introduction to the method, Prof. Raschke presents his research efforts towards using s-SNOM, this new dimension in optical nanoprobe imaging, to access the functional properties of materials and systems including electronic materials, energy materials, nano-biomaterials, quantum systems, and more.</p><p>Following Prof. Raschke’s comprehensive presentation, he answers questions from the audience covering topics from the maximum sensitivity level of s-SNOM to the use of complementary AFM techniques with s-SNOM.&nbsp;</p></div>

Bruker: Recent Advancements in Infrared Nano-imaging with Nano-FTIR Spectroscopy

Recent Advancements in Infrared Nano-imaging with Nano-FTIR Spectroscopy

Learn how s-SNOM advances understanding of the functional properties of materials

Advances in Infrared Nano-imaging with Nano-FTIR

<div><div><div><p><strong>Due to the systematic shrinking of the size of devices in the semiconductor industry, characterizing nanoscale surface contaminations in interconnects and circuitries has become a pivotal issue in test and failure analysis. Continuous development in process technology/engineering has led to the fabrication of semiconductor devices with sub-µm feature resolution, which in turn demands high-resolution analytical tools for proper characterization.&nbsp;</strong></p><p>Nanoscale AFM-IR spectroscopy is a non-destructive chemical analysis method that takes advantage of the nanoscale capabilities of AFM and outputs easy-to-understand, FTIR-like spectra. As described by the presenters, the advantages of nanoscale AFM-IR can be leveraged in the semiconductor industry in many ways, like for chemical characterization of organic contaminants, nano-patterned metal/low-k dielectrics, and directed self-assembly of block copolymers.</p></div></div></div><div><div><blockquote><ul><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/two-complementary-nanoscale-ir-techniques-photothermal-afm-ir-and-s-snom.html"><strong>watch part 1: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/online-demo-of-the-nanoir3-system-photothermal-afm-ir.html"><strong>watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/chemical-characterization-of-heterogenous-polymeric-materials-on-the-nanoscale-using-photothermal-afm-ir.html"><strong>watch part 3: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/2d-material-characterization-using-photothermal-afm-ir-and-s-snom.html"><strong>watch part 5: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li></ul></blockquote></div></div>

Bruker: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Characterizing nanometer-scale features in semiconductor devices using nanoIR spectroscopy

Nanoscale AFM-IR for Failure Analysis of Electronics

<div><p><span style="letter-spacing:0.0px;"><strong>This webinar will show you the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II.&nbsp;</strong></span></p><p>Our application specialist Eric Klein skips lengthy PowerPoint presentations and welcomes you directly to our demo lab for a hands-on instrument session. After 20 minutes of analyzing typical samples, Eric will answer your questions about using µ-FT-IR in your daily QC and failure analysis for at least 30 minutes.</p><p><strong>About the samples:</strong></p><ul><li>The first sample is a typical customer complaint which was returned due to an unknown contaminant on the products surface.</li><li>The second sample is is a product contamination found during quality control. It is analyzed to understand the contamination route and prevent recurrence.</li></ul><p><strong>Content of webinar:</strong></p><ul><li>Measurement two typical µ-FT-IR samples</li><li>Detection and identification of unknown contaminants</li><li>Q&amp;A session on failure analysis by FT-IR</li></ul><p><strong>What you'll learn:</strong></p><ul><li>How to FT-IR microscopy is used to analyze contaminations.</li><li>How to apply the LUMOS II FT-IR microscope</li><li>How to evaluate using OPUS software</li></ul><blockquote><p><strong>Presenter: </strong>Eric Klein&nbsp;</p><p>Eric Klein has been with Bruker for 10 years and started out as an application scientist. During this time, he has acquired a great deal of expertise in infrared microscopy and, as a product manager, played a leading role in the development of LUMOS II. The session will be moderated.</p></blockquote></div>

Bruker: About Failure Analysis, Customer Complaints and Troubleshooting

About Failure Analysis, Customer Complaints and Troubleshooting

This webinar will show you the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II. 