5973 Inert Performance Electronics: Considerations for GC/MS Methods in Scan and Selective-Ion Monitoring Modes
Technické články | 2004 | Agilent TechnologiesInstrumentation
GC/MSD
IndustriesŽivotní prostředí, Potraviny a zemědělství, Forenzní analýza a toxikologie, Průmysl a chemie, Materiálová analýza
ManufacturerAgilent Technologies
Key wordsscan, width, parameters, peak, time, speed, msd, sim, considerations, mass, number, acquisitions, dwell, over, autosim, scans, sampling, ion, times, fast, acquired, electronics, increasing, range, temperature, ferrule, decreasing, group, parses, each, scanning, crowding, simply, oven, upkeep, particular, more, peaks, injection, surveys, electronic, always, chromatographic, flow, studies, produce, unnecessarily, qualitative, constant, narrowest
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