The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

s High Performance Gas Chromatograph Time-of-Flight Mass Spectrometer AccuTOF GC series Applications Notebook Edition April 2016 AccuTOF GC series Applications Notebook Edition April 2016 Table of Contents Introduction ................................................................................................................. 1 New Gas Chromatography / High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC…

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