Applications from the field of Semiconductor Analysis | LabRulez GCMS

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications

| 2015 | Agilent Technologies

GC, Speciation analysis, ICP/MS/MS

Instrumentation

GC, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

AccuTOF GC series Applications Notebook

Applications

| 2016 | JEOL

GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF

Instrumentation

GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF

Manufacturer

Agilent Technologies, JEOL

Industries

Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Others

The power of exact mass measurement: an example of unknown compound identification

Applications

| 2006 | JEOL

GC/MSD, GC/TOF

Instrumentation

GC/MSD, GC/TOF

Manufacturer

Agilent Technologies, JEOL

Industries

Materials Testing, Semiconductor Analysis

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Applications

| 2020 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ

Applications

| 2016 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Guides

| 2022 | Agilent Technologies

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies, Elemental Scientific

Industries

Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications

| 2014 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Applications from the field of Semiconductor Analysis | LabRulez GCMS

Optical Characterization of Materials Using Spectroscopy

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

AccuTOF GC series Applications Notebook

The power of exact mass measurement: an example of unknown compound identification

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

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