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Using GC/MSD with High Efficiency Source and Hydrogen Cleaning to detect low level contaminants in ethylene and propylene

 

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ASMS 2016 Poster number: TP161 Title: Using GC/MSD with High Efficiency Source and JetClean to detect low level contaminants in ethylene and propylene Authors: Angela Smith Henry1 ([email protected]), Bruce D. Quimby1 ([email protected]), Badr Astiphan2 ([email protected]), 1Agilent Technologies, 2850 Centerville Road,…
Key words
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CONTAMINANTS IN ETHYLENE AND PROPYLENE ULTRA TRACE LEVEL DETECTION Technology Advantage: Agilent HES and Agilent JetClean Self‑Cleaning Ion Source Introduction Developments with metallocene catalysts have increased productivity for the polymerization of ethylene and propylene; however, these catalysts can also be…
Key words
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Analysis of Arsine and Phosphine in Ethylene and Propylene Using the Agilent Arsine Phosphine GC/MS Analyzer with a High Efficiency Source Application Note Petrochemical Authors Abstract Angela Smith Henry and Bruce Quimby The Agilent Arsine Phosphine GC/MS analyzer enables detection…
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JetClean Self cleaning ion source
2016|Agilent Technologies|Presentations
ANY ANALYTE, ANY METHOD, ONE PARTNER ONLY AGILENT COVERS ALL YOUR MASS SPEC NEEDS July 13, 2016 Page 1 JetClean Self-cleaning ion source Elizabeth Almasi Applications Manager June 9, 2016 What are your plans for the weekend? Cleaning is a…
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