Using GC/MSD with High Efficiency Source and JetClean to detect low level contaminants in ethylene and propylene
Posters | 2016 | Agilent TechnologiesInstrumentation
GC/MSD, GC/SQ
IndustriesEnergy & Chemicals
ManufacturerAgilent Technologies
Key wordsjetclean, propylene, picogram, ethylene, source, cos, precision, efficiency, sub, metallocene, perm, temp, arsine, time, sensitivity, inert, path, indistinguishable, contaminants, detect, dilutor, phosphine, high, abundance, stability, olefin, hes, setpoint, polymerization, catalysts, oven, cal, transfer, developments, permeation, line, detects, isothermal, level, events, regulation, deactivated, quad, ultimate, union, box, low, tune, tubes, stainless
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cos, cospicogram, picogramjetclean, jetcleanpropylene, propyleneethylene, ethylenematrix, matrixsub, subsource, sourceprecision, precisionethane, ethanediscussionin, discussioninresultslevel, resultslevelefficiency, efficiencymetallocene, metalloceneperm
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ethylene, ethylenepropylene, propylenecos, cosolefin, olefincontaminants, contaminantsethane, ethanematrix, matrixsubpicogram, subpicogrammetallocene, metallocenecalibrants, calibrantshes, hesproducers, producerscatalysts, catalystsmitigate, mitigatemin
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arsine, arsinephosphine, phosphinecontaminants, contaminantsanalyzer, analyzerscis, scisethylene, ethyleneagilent, agilentsource, sourceefficiency, efficiencycos, cosdigit, digithes, hespolymerization, polymerizationcleaning, cleaningidl
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sulfur, sulfurtht, thtbush, bushdms, dmsfpd, fpdcos, cosetsh, etsharsine, arsinepropylene, propylenephosphine, phosphinehydrocarbon, hydrocarbongaspro, gaspromin, minmakeup, makeupinterference