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Applications from the field of Semiconductor Analysis - page 4

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis

Phthalate Analysis in Accordance with an IEC Standard Method

Applications
| N/A | CDS Analytical
GC/MSD, Pyrolysis
Instrumentation
GC/MSD, Pyrolysis
Manufacturer
CDS Analytical
Industries
Semiconductor Analysis

Thermal Desorption Analysis of Si Wafer Contaminants

Applications
| N/A | GL Sciences
GC/MSD, Thermal desorption, GC/SQ
Instrumentation
GC/MSD, Thermal desorption, GC/SQ
Manufacturer
Shimadzu, CTC Analytics, GL Sciences
Industries
Semiconductor Analysis

On-Line Thermal Desorption Analysis As Replacement for Solvent Extraction Methods

Applications
| N/A | CDS Analytical
GC, Thermal desorption
Instrumentation
GC, Thermal desorption
Manufacturer
Buck Scientific, CDS Analytical
Industries
Semiconductor Analysis
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