Introduction to Photothermal AFM-IR for Infrared Spectroscopists

Highly productive nanoscale spectroscopy that is easy to use and easy to interpret

With photothermal atomic force microscope infrared spectroscopy (AFM-IR), chemical identification at the nanoscale is achieved by measuring local IR spectra directly at the AFM tip. This method stands out among nanoscale spectroscopic approaches for its user-friendly operation, straightforward data interpretation, fast measurement times, and reliable repeatability. Bruker's AFM-IR technology delivers monolayer sensitivity, offers spatial resolution below 10 nm, accommodates various probing depths, and supports correlative analysis of chemical and mechanical properties.

In this webinar, Bruker experts will provide a thorough introduction to photothermal AFM-IR, tailored for IR spectroscopists. They will share explanations of underlying physics, examples of FTIR spectral correlation, and practical experimental considerations.

Join us to learn:

• How the technique works, both theoretically and practically
• Why AFM-IR is spectrally correlated with FTIR
• When AFM-IR is an ideal technique choice
• What experimental factors impact AFM-IR spectra

Webinar Summary

Photothermal atomic force microscope infrared spectroscopy (AFM-IR) enables chemical identification at the nanoscale by collecting local infrared spectra at the AFM tip. Compared to other nanoscale spectroscopic techniques, AFM-IR provides major advantages in ease of use, ease of interpretation, measurement speed, and data repeatability. The AFM-IR technique developed at Bruker has achieved monolayer sensitivity, sub-10 nm spatial resolution, a range of probing depths, and correlative measurements of chemical and mechanical properties.

The AFM-IR signal is proportional to sample absorption coefficients of the IR irradiation, leading to correlation between the collected AFM-IR spectra and the transmission mode bulk Fourier transform infrared (FTIR) spectra. This correlation is critical and forms the basis of the chemical identification capability of the AFM-IR technique. Several application examples in different research fields will be highlighted to demonstrate such correlation. Valuable nanoscale chemical information is extracted from the AFM-IR spectra’s peak ratios, band positions and shapes. After that, experimental factors that may impact the AFM-IR spectra will be discussed. These factors need to be properly considered to have correct interpretations of the AFM-IR spectra.

Featured Products and Technology

• NanoIR Spectrometers: Bruker's nanoIR spectrometers are the world leader in photothermal IR spectroscopy from the nanoscale to the sub-micron and macro scales.
• Dimension IconIR: Flagship photothermal AFM-IR system, offering correlative imaging modes and 150 mm of sample access for ultimate versatility in materials research and industrial R&D

Speaker: Cassandra Phillips, Ph.D. (Senior Product Manager, Bruker)

Cassandra did her Ph.D. at the University of Toronto exploring the photophysics of boron nitride nanotubes using scattering scanning nearfield optical microscopy (s-SNOM) and computational models. She has been working at Bruker Nano Surfaces and Metrology since September 2019 as an Applications Scientist focusing on nanoscale IR spectro-microscopy and other correlated imaging techniques realized with atomic force microscopy.

Speaker: Dr. Qichi Hu (Senior Applications Scientist)

Qichi is currently a Senior Staff Applications Scientist at Bruker Nano. He received a bachelor’s degree from Peking University and Ph.D. from University of British Columbia. He then did postdocs in U.S. university and national labs. Qichi has been working on nanoIR development and applications for over a decade, at Anasys and now at Bruker.

Speaker: Hartmut Stadler, Ph.D. (Applications Engineer, Bruker Nano GmbH)

Hartmut Stadler works as an application scientist for Bruker Nano Surfaces and is now mainly focussed on the chemical side of AFM, including electrochemical operation and nanoscale IR techniques. His background is Physical Chemistry, with a PhD thesis in the field of biofilm characterization using macroscopic and nanoscopic methods. Since more than 25 years he operates AFMs and since more than 20 years he supports Bruker’s European AFM customers and distribution channel partners in AFM-application related questions.