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Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM

RECORD | Already taken place Sa, 31.12.2022
This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM).
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Bruker: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM
Bruker: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM

This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM).

The presenter, Dr. Phillips, differentiates AFM-IR and s-SNOM by comparing them to more familiar techniques:  

  • AFM-IR is like a nanoscale FTIR
  • s-SNOM is like a nanoscale ellipsometry

Dr. Phillips delves into the fundamentals behind AFM-IR and s-SNOM. Both complementary modes are combined in Bruker’s nanoIR3-s platform.

Also included in this in-depth introductory webinar are:

  • Exemplary case studies for both AFM-IR and s-SNOM
  • System configuration descriptions, accompanied by real-machine images
  • An extensive Q&A session, where the presenter answers audience questions

In the Q&A session, viewers can expect to hear the answers to:

  • Can AFM-IR be performed in fluid?
  • What are typical sample requirements for nanoscale IR techniques?
  • What is the probing depth of the laser and that of each technique?
  • Can nanoscale IR techniques be performed using a synchrotron source? 
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