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Analysis of Surface Chemistry by FT-IR Spectroscopy

RECORD | Already taken place Sa, 31.12.2022
Bruker cares about your need and presents you the INVENIO spectrometer platform to make your daily work easy and convenient.
Go to the webinar
Bruker: Analysis of Surface Chemistry by FT-IR Spectroscopy
Bruker: Analysis of Surface Chemistry by FT-IR Spectroscopy

FT-IR technique is an indispensable analytical tool in most chemical labs, analytical centers and quality control departments. FT-IR spectroscopy is an ease to use and non-destructive analytical method for verification, identification or quantification. To face the daily challenges arising from high sample amount, unknown materials and multiple (maybe unexperienced) users, you need a highly flexible FT-IR spectrometer with user-friendly automation and outstanding performance.

Bruker cares about your need and presents you the INVENIO spectrometer platform to make your daily work easy and convenient. In the upcoming free-of-charge webinar on the 18th of March we will focus on the difficulties in analytical labs and explain which features of INVENIO can help in such situations. 

Key Learning Objectives

The latest advances in the instrumentation and applications of vibrational spectroscopy for the chemical analysis of surfaces will be reviewed in this presentation with a thorough discussion of the following topics:

  • Surface characterization techniques: ATR (attenuated total reflection), including GATR (grazing angle germanium ATR): External (specular) reflection, including IRRAS (infrared reflection and absorption spectroscopy); and DRIFTS (Diffuse Reflection Infrared Fourier Transform Spectroscopy)
  • Characterization of thin films and molecular monolayers deposited onto metallic, semiconductor, and dielectric substrates
  • Heterogeneous gas-solid catalysis studies of gases interacting with catalytic surfaces
  • Optimization of FT-IR instrument parameters for surface analysis
  • Techniques to reduce the spectral contribution of atmospheric water and CO2

Presenter: Dr. Sergey Shilov (North America Product Manager, Science Business Unit, Bruker Optics)

Dr. Sergey V. Shilov is a Product Manager for North America at Bruker Optics. Sergey joined Bruker in 2001. He is responsible for the support and development of new applications for the Bruker research FTIR systems. He received his Ph.D. in 1992 from the Russian Academy of Sciences in Polymer Physics and his M.S. from St. Petersburg State University (Russia) in Physics in 1986. Alexander Von Humboldt Foundation (Germany) awarded him a research fellowship in 1996. Sergey published 37 papers in peer-reviewed journals. His research interests include time-resolved FTIR spectroscopy, surface science, polymer, and life-science applications. 

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