Measuring Diffuse Powders and Films With UV-VIS-NIR
Measuring scattering samples with UV-VIS-NIR can be challenging for basic instruments. These samples will have diffuse reflectance or transmission and less light hitting your detector.
In this presentation, we will discuss diffuse reflectance accessories (DRAs) for collecting all light in a measurement as well as Agilent's universal measurement accessory (UMA) for measuring the angular distribution of the reflected light.
Presenter: Scott Melis, PhD (Application Scientist, Agilent Technologies, Inc.)
Scott Melis has a PHD in Physics from Georgetown University in Washington, DC and started with Agilent in 2021 as a Molecular Spectroscopy Application Scientist. In his graduate work, Scott studied nanoparticle formation and growth for a variety of applications. Projects that he worked with include developing processes to deposit and characterize semiconducting molecular nano-cocrystals for use in optoelectronic devices as well as controlling polymer nanoparticle size through rapid mixing conditions.
