Non-Destructive Analysis of Substrates and Contaminants by Handheld FTIR

Ensuring the cleanliness and integrity of substrates before bonding or coating is a crucial application in numerous industries.

Contaminants, even in trace amounts, can significantly impact a substrate's surface, affecting its stiction (static friction) properties. This, in turn, can lead to compromised bond strength and adhesive properties, causing premature wear and, ultimately, material failure.

Our webinar will delve into the cutting-edge technology of the Agilent 4300 handheld FTIR spectrometer, specially equipped with the specular reflectance interface. This powerful tool enables precise identification of substrate materials and evaluation of the presence of contaminants. Moreover, it allows for accurate quantification of these contaminants, ensuring your substrates meet the highest quality standards.

Why attend this webinar?

• Understand the importance of substrate analysis identifying and characterizing various substrate materials.

• Gain insights into the cutting-edge Agilent 4300 handheld FTIR spectrometer.

• Discover practical techniques for detecting and characterizing various substrate materials and contaminants.

Presenter: Donald Inglis (Product Specialist EMEAI for FTIR, Agilent Technologies)

Donald Inglis has worked in analytical instrumentation for over 30 years. He started his career as a field service engineer in chromatography and mass spectroscopy before moving into commercial sales; he has been a product specialist in portable and handheld FTIR and Raman systems at Agilent for over a decade. His role at Agilent involves advising customers on, and building solutions for, the various analytical challenges they face in their workspace.