Techniques for Avoiding Unexpected Problems in LC and GC Analysis

We, 18.10.2023, 17:00 (CEST)
We will cover topics including peak shape, ghost peaks, tailing peaks, split peaks, missing peaks, variable retention times, high backpressure, instrument contamination, and ion suppression.
Agilent Technologies: Techniques for Avoiding Unexpected Problems in LC and GC Analysis

Agilent Technologies: Techniques for Avoiding Unexpected Problems in LC and GC Analysis

Chromatography can be complicated. Sample preparation is important, but not always used correctly. This webinar will cover some unexpected problems and solutions to generate better data. We will cover topics including peak shape, ghost peaks, tailing peaks, split peaks, missing peaks, variable retention times, high backpressure, instrument contamination, and ion suppression.

We will go over strategies for cleaning up your sample, protecting your column and instrument from sample matrix contamination, and getting reliable, reproducible, and accurate results from your chromatography.

Presenter: Alex Ucci (Application Engineer, Agilent Technologies, Inc.)

In his current position at Agilent, Alex provides application assistance and technical support for sample preparation products as well as GC and LC consumables. Before he joined Agilent in 2014, Alex was a graduate student at the Pennsylvania State University researching the morphology and surface properties of aerosol particles using a wide variety of analytical techniques. He has an MS degree in chemistry.

Agilent Technologies