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Encoded Frequent Pushing™

Technical notes | 2018 | LECOInstrumentation
GC/MSD, GC/HRMS, GC/TOF
Industries
Manufacturer
LECO

Summary

Importance of the Topic


The efficiency of ion utilization in orthogonal accelerator time‐of‐flight mass spectrometry (OA‐TOFMS) directly impacts sensitivity and limit of detection. Duty cycle, defined as the fraction of ions entering the analyzer that are actually pulsed into flight, is often limited to 20% in conventional OA‐TOFMS. Improving duty cycle without sacrificing resolution or mass range is therefore a critical challenge in high‐resolution TOF instruments.

Study Objectives and Overview


This work introduces Encoded Frequent Pushing™ (EFP™), a novel pulsing and decoding scheme designed to boost duty cycle in folded flight path (FFP) multi‐reflecting TOF mass analyzers. LECO’s Pegasus GC‐HRT system, featuring an FFP analyzer with resolving power >25,000 and LOD of 1 pg OFN, serves as the testbed for EFP implementation. The aim is to multiplex accelerator pushes while avoiding spectral artifacts and preserving high mass resolution.

Methodology and Used Instrumentation


EFP encodes multiple extraction pulses per transient at uniquely spaced time intervals, eliminating systematic overlaps among ion species. A logical‐statistical decoding algorithm reconstructs individual spectra from the overlaid signals, rejecting incoherent noise. Key instrumentation includes:
  • LECO Pegasus GC‐HRT GC-TOFMS with FFP analyzer
  • Custom orthogonal accelerator pulser capable of 2 kHz (standard) and 20 kHz (EFP) extraction rates
  • High‐capacity TOF detector optimized for increased ion throughput

Main Results and Discussion


EFP provides up to tenfold sensitivity gain by raising the effective push frequency from 2 to ~20 kHz, as demonstrated in trace analyte detection within complex matrices. Low‐abundance isotopes, previously undetected in single‐push mode, become clearly visible, extending the lower end of the linear dynamic range without altering saturation limits at high concentrations. Noise reduction is achieved by discarding non‐coherent signals, lowering both electrical and random chemical background. The continuous full m/z range (10–1500) remains accessible, and improved ion statistics enhance mass accuracy (∼1 ppm at m/z 219) under high‐speed GC×GC acquisition (200 spectra/s). Limitations arise if spectra become overcrowded, potentially challenging decoding; however, standard GC separations maintain sparse peak distributions compatible with EFP.

Benefits and Practical Applications


EFP delivers robust gains in sensitivity, dynamic range, mass accuracy, and noise suppression without compromising resolution or mass range. Applications span environmental trace analysis, forensic screening, petrochemical QA/QC, and high‐throughput GC×GC workflows where low‐level compound detection and precise mass measurement are essential.

Future Trends and Potential Applications


Further developments may include adaptive encoding schemes driven by real‐time feedback, integration with machine‐learning deconvolution algorithms, and extension of EFP concepts to other multiplexed TOF configurations. Enhanced detector technologies and parallelized pulsing architectures could push effective duty cycles closer to 100%.

Conclusion


Encoded Frequent Pushing™ offers a practical solution to the duty cycle limitation in high‐resolution FFP TOFMS, yielding substantial improvements in sensitivity, dynamic range, noise suppression, and mass accuracy without sacrificing mass range or resolution. EFP thus represents a significant advance for modern analytical mass spectrometry.

References

  • M. Guilhaus, D. Selby, V. Mlynski. Orthogonal acceleration time-of-flight mass spectrometry. Mass Spectrom. Rev., 2000, 19, 65–107.
  • J. Franzen. High resolution method for using time-of-flight mass spectrometers with orthogonal ion injection. US Pat. 6,861,645, 2003.
  • D. Kenny, J. Wildgoose. An orthogonal acceleration time-of-flight mass spectrometer. GB Pat. 2,445,679, 2007.
  • F. Knorr. Fourier transform time-of-flight mass spectrometer. US Pat. 4,707,602, 1985.
  • A. Brock, N. Rodriguez, R. Zare. Time-of-flight mass spectrometer and ion analysis. US Pat. 6,300,626, 1999.
  • M. Belov, C. Fancher, P. Foley. Multiplexed orthogonal time-of-flight mass spectrometer. US Pat. 6,900,431, 2003.
  • A. Verenchikov. Electrostatic mass spectrometer with encoded frequent pulses. US Pat. 8,853,623, 2011.

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