Fast USEPA 8270 Semivolatiles Analysis Using the 6890N/5975 inert GC/MSD

Significance of the Topic

Environmental monitoring and compliance testing require the accurate measurement of a diverse mix of semivolatile compounds over a wide concentration range. Traditional USEPA Method 8270 analyses often take 25–40 minutes per run, limiting laboratory throughput. By reducing run times and lowering minimum detection limits, environmental laboratories can improve efficiency and responsiveness in contamination assessment and regulatory compliance.

Objectives and Study Overview

This study evaluates the performance of the Agilent 6890N/5975 inert GC/MSD system for fast semivolatile analysis following USEPA Method 8270. The primary goals are to demonstrate:

• Reduced analysis time using narrow-bore columns and accelerated scan rates
• Maintained sensitivity, linearity, and minimum detection limits
• Robust retention time stability via Retention Time Locking

Methodology and Instrumentation

A pulsed splitless injection of 0.5 µL sample was used with an Agilent 6890N GC equipped with a DB-5.625 column (20 m × 0.18 mm, 0.36 µm). The oven ramped at 25 °C/min from 55 °C to 320 °C, yielding a 15.4 min run time. Key features include:

• Inert 5975 MSD source with a 6 mm drawout lens to minimize analyte adsorption
• Automatic DFTPP tune with a 25 µA emission current and reduced sampling rate (1 scan at 5.92 scans/s)
• Retention Time Locking to phenanthrene-d10 at 8.700 min for consistent retention times
• Calibration across ten concentration levels (1–200 ppm) for 77 target analytes plus six internal standards

Main Results and Discussion

The system passed tune criteria at both 50 ppm and 5 ppm. Calibration data showed:

• Average relative response factors (RRFs) for System Performance Check Compounds well above the 0.05 threshold
• RSDs of RRFs for Calibration Check Compounds all under the 30% criterion (average 7% RSD versus the 15% method requirement)
• High sensitivity and signal-to-noise at low-level calibration points

These results confirm linearity and robustness over a broad dynamic range, delivering reliable quantification in a 15-minute run.

Benefits and Practical Applications

The optimized method offers:

• Significantly reduced analysis and cool-down times
• Lower minimum detection limits through inert source technology
• Consistent performance with minimal maintenance demands
• Improved data quality and integration consistency across environmental sample sets

Future Trends and Possible Applications

Ongoing developments may include:

• Further miniaturization of column dimensions and faster electronics for sub-15-minute runs
• Enhanced automated tuning and retention time alignment tools
• Adaptation to emerging semivolatile compounds and complex matrices
• Integration with automated sample preparation and data analytics platforms

Conclusion

The Agilent 6890N/5975 inert GC/MSD meets and exceeds USEPA Method 8270D requirements, achieving high sensitivity, excellent linearity, and robust retention time control in a streamlined 15-minute workflow. This method enhances laboratory productivity and data reliability for environmental semivolatile analysis.

References

1. Szelewski M., Wilson B., Perkins P. Improvements in the Agilent 6890/5973 GC/MSD System for Use with USEPA Method 8270. Agilent Technologies, publication 5988-3072EN.
2. Szelewski M. Fast Semivolatiles Analysis using the Agilent Technologies 6890/5973 inert GC/MSD. Agilent Technologies, publication 5989-0207EN.
3. Szelewski M. Fast USEPA 8270 Semivolatiles Analysis using the 6890/5973 inert GC/MSD with Performance Electronics. Agilent Technologies, publication 5989-1510EN.
4. Weiner K., Mata N., Wylie P. Retention Time Locking with the G1701BA MSD Productivity ChemStation. Agilent Technologies, publication 5968-3433E.