Analysis of Polymers and Plastics
Brochures and specifications | 2021 | Bruker OpticsInstrumentation
Reliable quality control and failure analysis of polymers and plastics is critical for modern manufacturing, enabling cost‐effective production of high‐performance materials while minimizing waste and defects. FT‐IR techniques offer rapid, non‐destructive molecular fingerprinting across raw materials, intermediates, and finished products, ensuring consistency and traceability in industries ranging from automotive to packaging.
This application note demonstrates how Bruker’s FT‐IR platforms—the ALPHA II benchtop spectrometer, the LUMOS II FT‐IR microscope, and the INVENIO research system—can be employed for routine quality control, advanced material characterization and failure analysis. It highlights workflows for identity verification, compositional quantification, micro‐scale defect analysis and thermogravimetric‐IR coupling for outgassing and decomposition studies.
FT‐IR spectroscopy with ATR sampling enables rapid collection of infrared spectra directly from pellets, films, liquids and solids without consumables or extensive preparation. Lateral resolution in the micrometer range is achieved using the LUMOS II microscope for localized analyses. Coupling thermobalances (e.g. NETZSCH TG) to FT‐IR via transfer lines or integrated interfaces (PERSEUS®) allows simultaneous gravimetric and gas‐phase spectral monitoring.
Rapid material identification was achieved in under one minute, matching sample spectra against libraries. Microscale failure analysis using LUMOS II revealed inclusions, phase inhomogeneities and composite layer structures. Quantitative ATR‐FT‐IR methods determined filler and additive levels, polyamide variants, and cure conversion in coatings. TG‐IR experiments on EVA samples identified acetic acid and polymer backbone decomposition products at distinct temperatures, illustrating the strength of combined thermal and spectroscopic diagnostics.
Advances in spectral libraries, chemometric models and artificial intelligence will further automate material identification and quantification. Integration of FT‐IR sensors for in‐line and at‐line process monitoring, miniaturized portable analysers for warehouse or field use, and enhanced coupling with complementary techniques (e.g. Raman, mass spectrometry) will broaden analytical capabilities in polymer R&D and quality assurance.
Bruker’s suite of FT‐IR instruments provides a versatile, robust and user‐friendly toolbox for polymer quality control, failure analysis, and advanced material research. By combining rapid ATR measurements, high-resolution microanalysis and TG‐IR coupling, these platforms deliver comprehensive insights into polymer composition, homogeneity, thermal behavior and defect origins.
No references were provided in the source document.
FTIR Spectroscopy, Microscopy
IndustriesManufacturerBruker
Summary
Importance of the Topic
Reliable quality control and failure analysis of polymers and plastics is critical for modern manufacturing, enabling cost‐effective production of high‐performance materials while minimizing waste and defects. FT‐IR techniques offer rapid, non‐destructive molecular fingerprinting across raw materials, intermediates, and finished products, ensuring consistency and traceability in industries ranging from automotive to packaging.
Objectives and Study Overview
This application note demonstrates how Bruker’s FT‐IR platforms—the ALPHA II benchtop spectrometer, the LUMOS II FT‐IR microscope, and the INVENIO research system—can be employed for routine quality control, advanced material characterization and failure analysis. It highlights workflows for identity verification, compositional quantification, micro‐scale defect analysis and thermogravimetric‐IR coupling for outgassing and decomposition studies.
Methodology
FT‐IR spectroscopy with ATR sampling enables rapid collection of infrared spectra directly from pellets, films, liquids and solids without consumables or extensive preparation. Lateral resolution in the micrometer range is achieved using the LUMOS II microscope for localized analyses. Coupling thermobalances (e.g. NETZSCH TG) to FT‐IR via transfer lines or integrated interfaces (PERSEUS®) allows simultaneous gravimetric and gas‐phase spectral monitoring.
Used Instrumentation
- ALPHA II FT‐IR spectrometer with diamond ATR interface
- LUMOS II FT‐IR microscope for microanalysis
- INVENIO research‐grade FT‐IR platform
- NETZSCH PERSEUS® TG‐IR integrated system
- NETZSCH STA 449 F1 Jupiter® coupled via external gas cell
Key Results and Discussion
Rapid material identification was achieved in under one minute, matching sample spectra against libraries. Microscale failure analysis using LUMOS II revealed inclusions, phase inhomogeneities and composite layer structures. Quantitative ATR‐FT‐IR methods determined filler and additive levels, polyamide variants, and cure conversion in coatings. TG‐IR experiments on EVA samples identified acetic acid and polymer backbone decomposition products at distinct temperatures, illustrating the strength of combined thermal and spectroscopic diagnostics.
Benefits and Practical Applications
- Fast, non‐destructive verification of raw materials and final products
- Automated workflows suitable for non‐expert operators
- Microscopic mapping of composition and defect localization
- Cost and time savings compared to wet‐chemical methods
- Comprehensive thermal‐chemical analysis via TG‐IR coupling
Future Trends and Potential Applications
Advances in spectral libraries, chemometric models and artificial intelligence will further automate material identification and quantification. Integration of FT‐IR sensors for in‐line and at‐line process monitoring, miniaturized portable analysers for warehouse or field use, and enhanced coupling with complementary techniques (e.g. Raman, mass spectrometry) will broaden analytical capabilities in polymer R&D and quality assurance.
Conclusion
Bruker’s suite of FT‐IR instruments provides a versatile, robust and user‐friendly toolbox for polymer quality control, failure analysis, and advanced material research. By combining rapid ATR measurements, high-resolution microanalysis and TG‐IR coupling, these platforms deliver comprehensive insights into polymer composition, homogeneity, thermal behavior and defect origins.
References
No references were provided in the source document.
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