MATRIX II-MG Series FT-IR GAS ANALYZERS

Importance of the Topic

FT-IR based gas analyzers enable real-time, calibration-free quantification of diverse gas species with high sensitivity and spectral resolution. These instruments support critical applications in process control, emission monitoring, research and quality assurance, addressing the growing demand for precise and automated gas analysis in industry and science.

Objectives and Study Overview

The MATRIX II-MG Series by Bruker Optics offers configurable, rugged FT-IR gas analyzers designed for automated, high-precision monitoring of gas concentrations. With spectral resolutions down to 0.5 cm-1 and a calibration-free quantification approach, the series aims to streamline gas analysis workflows across multiple sectors, including industrial process control, greenhouse gas emission monitoring, battery gas analysis and trace impurity detection.

Methodology and Instrumentation

This study outlines the functional design of the MATRIX II-MG Series and the OPUS GA software. Key methodological features include:

• Gas cells with optical path lengths from 10 cm to 26 m to tailor sensitivity across concentration ranges from percent levels to parts per billion.
• RockSolid™ permanently aligned interferometer delivering stable spectral resolution better than 1 cm-1, optionally exceeding 0.5 cm-1.
• Detector options for different sensitivity and range requirements, including liquid-nitrogen cooled MCT, Stirling-cooled MCT, TE-MCT and DTGS.
• OPUS GA non-linear fitting algorithm for direct quantification of over 350 compounds without external calibration, accounting for temperature and pressure variations.
• Optional high-pressure measurement capability up to 15 bar absolute for in-situ analysis under elevated pressures.

Key Results and Discussion

The MATRIX II-MG Series demonstrates:

• Robust detection limits across a wide dynamic range due to optimized path lengths and high optical throughput.
• Rapid acquisition rates up to 5 Hz at high spectral resolution, supporting real-time monitoring of fast reactions.
• Calibration-free quantification accuracy enabled by comprehensive spectral libraries and advanced fitting routines, even in the presence of overlapping interferents.
• Stable long-term performance under industrial conditions, with heated cells preventing condensation and gold-coated optics ensuring corrosion resistance.

Benefits and Practical Applications

• Industrial process control: seamless integration with control systems via Modbus TCP/RTU, analog outputs and web interfaces.
• Environmental monitoring: precise identification and quantification of NOx, SF6 and other greenhouse gases in complex mixtures.
• Scientific research: flexibility to add new compounds on-the-fly in OPUS GA without recalibration, ideal for catalytic reaction studies.
• Quality assurance: trace gas and purity analysis with ppb-level sensitivity for gases and specialty applications like battery off-gas analysis.

Future Trends and Applications

Advancements in detector technology and miniaturization are expected to further enhance sensitivity and deployment flexibility. Integration with machine learning algorithms for predictive analytics and automated anomaly detection could unlock new possibilities in continuous emissions monitoring and adaptive process control. Expanding spectral libraries for emerging industrial gases and coupling FT-IR analysis with complementary techniques will broaden the analytical scope.

Conclusion

The MATRIX II-MG Series represents a versatile, high-performance solution for real-time FT-IR gas analysis. Its calibration-free workflow, modular instrumentation and robust design cater to a wide array of applications, facilitating reliable, user-friendly gas monitoring in industrial, environmental and research settings.

Used Instrumentation

• MATRIX II-MG FT-IR gas analyzers (0.1 to 26 m optical path cells)
• RockSolid™ permanently aligned interferometer
• Detectors: LN2-cooled MCT, Stirling-cooled MCT, TE-MCT, DTGS
• OPUS GA gas analysis software with non-linear fitting algorithm
• Temperature and pressure sensors for in-situ monitoring