INVENIO ® X The fully automated advanced R&D Spectrometer

Significance of Advanced FTIR Spectroscopy

Fourier transform infrared (FTIR) spectroscopy remains a cornerstone technique in research and industry for molecular characterization across a broad spectral range. Fully automated, high–resolution instruments streamline workflows, improve data reproducibility and open new possibilities in time-resolved and multispectral analyses.

Objectives and Overview of INVENIO X

The INVENIO X platform introduces an integrated solution for routine and advanced R&D FTIR workflows. Its goals are to:

• Provide seamless coverage from far infrared (FIR) to visible/UV (80 cm⁻¹ to 28 000 cm⁻¹).
• Automate beamsplitter and detector exchanges to eliminate manual intervention.
• Deliver sub-0.085 cm⁻¹ spectral resolution with exceptional reproducibility.
• Support diverse applications including spectroscopy of gases, solids, liquids, time-resolved studies and microscopy.

Methodology and Used Instrumentation

The core innovation is the INTEGRAL™ interferometer featuring:

• Wear-free, actively aligned cube-corner optics.
• Automatic three-position beamsplitter (BMS) changer wheel achieving <0.085 cm⁻¹ resolution.
• MultiTect™ detector module accommodating up to five room-temperature detectors (DTGS, InGaAs, Si, GaP) and one user-exchangeable DigiTect™ slot for cryogenic MCT or other specialized detectors.
• Transit™ channel with dedicated mid-IR detector for rapid transmittance measurements without occupying the main compartment.
• Up to two internal and two external source ports (MID and tungsten) with internal CenterGlow™ emitter for high stability.
• Eight-position internal filter wheel and five-position attenuator wheel for automatic validation and dynamic range control.

Optional modules include:

• Hyperion FTIR microscopy for chemical imaging and direct emission measurements.
• RAM II FT-Raman unit with fluorescence suppression.
• PL II photoluminescence module for semiconductor analysis.
• PMA 50 polarization modulation accessories for VCD and PM-IRRAS.
• TGA coupling for simultaneous thermogravimetry–FTIR analysis.

OPUS software drives acquisition, processing, validation and quality workflows. OPUS-TOUCH offers a dedicated touchscreen interface for intuitive control.

Key Features and Performance

Repeated measurement series with automatic beamsplitter swaps demonstrate perfect spectral reproducibility over 100 cycles. High spectral resolution (<0.085 cm⁻¹) resolves fine gas rotational-vibrational lines (e.g., CH₄ P/Q/R branches at 0.085 cm⁻¹). Rapid-scan kinetics (<15 ms time resolution) and step-scan time-resolved spectroscopy (ns temporal resolution) enable monitoring of electrochemical and laser diode switching events. Broadband FIR-VIS/UV transmittance of packaging films and emission microscopy of MIR diodes highlight the fully automated range coverage.

Applications and Practical Benefits

• Gas phase spectroscopy with high resolution for isotopic and trace analysis.
• Raman and VCD for mineral identification and chiral molecule characterization.
• Time-resolved spectroelectrochemistry and laser dynamics studies.
• Automated multispectral routine screening across FIR to UV without optical swaps.
• High-throughput chemical imaging and external accessory integration via multiple beam ports.

Future Trends and Potential Developments

Integration of artificial intelligence for automated spectral interpretation and real-time chemometric feedback will enhance decision-making. Expansion into ultrafast pump-probe and terahertz domains, combined multispectral microscopy modalities and cloud-based data management are anticipated. Further miniaturization and field-upgrade kits will broaden accessibility in remote and on-site analytical scenarios.

Conclusion

INVENIO X represents a new benchmark in fully automated, high-resolution FTIR spectroscopy. Its combination of INTEGRAL™ interferometer, MultiTect™ detectors and flexible modularity addresses the highest demands in modern analytical laboratories, accelerating research and improving reproducibility across a wide range of applications.

Reference

Bruker Optics. INVENIO X Product Brochure BOPT-4001287-01, 2019.