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Applications - page 39
Agilent Cary Universal Measurement Accessory (UMA)
Technical notes
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Safety - Handling liquefied compressed gas
Technical notes
| 2013 | Air Products
Consumables
Instrumentation
Consumables
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Air Products
Industries
CryoEase® Argon service for ICP users
Technical notes
| 2013 | Air Products
Instrumentation
Manufacturer
Air Products
Industries
Bottled Water: Analyzing water purity for advanced chromatographic applications
Technical notes
| 2012 | ELGA LabWater
Laboratory instruments
Instrumentation
Laboratory instruments
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ELGA LabWater
Industries
Ultrapure water for Trace Element Determination
Technical notes
| 2012 | ELGA LabWater
Laboratory instruments, ICP/MS, AAS, ICP-OES
Instrumentation
Laboratory instruments, ICP/MS, AAS, ICP-OES
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ELGA LabWater
Industries
‘Fitted’ — Fast, accurate and fully- automated background correction
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Dedicated axial or radial plasma view for superior speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
True simultaneous ICP-OES for unmatched speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
FACT spectral deconvolution
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
CCD and CID solid-state detectors
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
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