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Applications - page 230
Surface Carbon on Steel Sheet and Rod Samples
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| 2008 | LECO
Elemental Analysis
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Elemental Analysis
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LECO
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Materials Testing, Energy & Chemicals
Hydrogen Determination in Reactive and Refractory Metals*
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| 2008 | LECO
Elemental Analysis
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Elemental Analysis
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LECO
Industries
Materials Testing, Energy & Chemicals
Errors Associated With Thin Film Measurements Using XPS at a Single Angle
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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Materials Testing
Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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Materials Testing
Method for Charge Compensation on Sigma Probe, Theta Probe and Theta 300
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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Materials Testing
Characterization of Silicon Oxide and Oxynitride Layers
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| 2008 | Thermo Fisher Scientific
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X-ray
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Thermo Fisher Scientific
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Materials Testing
High Resolution XPS Mapping
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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Parallel Angle-resolved XPS Analysis of a Self Assembled Monolayer with the Theta Probe
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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The Karlsruhe Micro Nose, KAMINA
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| 2008 | Thermo Fisher Scientific
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Thermo Fisher Scientific
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Materials Testing
Unattended Analysis of Multiple Insulating Samples
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| 2008 | Thermo Fisher Scientific
X-ray, Software
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X-ray, Software
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Thermo Fisher Scientific
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Materials Testing
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