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Applications - page 229
Ultratrace Analysis of Solar (Photovoltaic) Grade Bulk Silicon by ICP-MS
Applications
| 2008 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Direct Measurement of Trace Metals in Edible Oils by 7500cx ICP-MS with Octopole Reaction System
Applications
| 2008 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Mining Exploration and Geochemical Analysis of Mining Samples
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals , Materials Testing, Environmental
On-site Elemental Analysis of Art and Artifacts
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Analysing AF Elements
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Energy & Chemicals , Environmental
The Merits of Quantitative Element Mapping at Low Acceleration Voltage and High Magnification
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Errors Associated With Thin Film Measurements Using XPS at a Single Angle
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS
Applications
| 2008 | Thermo Fisher Scientific
X-ray
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
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