Applications - page 127

Transfer of Methods between Poroshell 120 EC-C18 and ZORBAX Eclipse Plus C18 Columns

Technical notes

| 2011 | Agilent Technologies

Consumables, LC columns

Instrumentation

Consumables, LC columns

Manufacturer

Agilent Technologies

Industries

Time- and peak-based fraction collection with the Agilent 1220 Infinity LC System

Technical notes

| 2011 | Agilent Technologies

HPLC

Instrumentation

HPLC

Manufacturer

Agilent Technologies

Industries

Enhancing the capabilities of the Agilent 1220 Infinity LC system with the Agilent 1260 Infinity Fluorescence Detector

Technical notes

| 2011 | Agilent Technologies

HPLC

Instrumentation

HPLC

Manufacturer

Agilent Technologies

Industries

The Use of TrendPlot Software for Routine Monitoring of Polymer QC Tandem Quadrupole Data

Technical notes

| 2011 | Waters

Software, LC/MS, LC/MS/MS, LC/QQQ

Instrumentation

Software, LC/MS, LC/MS/MS, LC/QQQ

Manufacturer

Waters

Industries

Energy & Chemicals

Comparing the limiting resolution of the Agilent Cary 5000 and Cary 6000i UVVis-NIR spectrophotometers using the transmission spectrum of water vapor

Technical notes

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Superior linear range (>3.5 Abs) of the Agilent Cary 60 UV-Vis

Technical notes

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Superior linearity and reproducibility using the Agilent Cary 60 for routine measurements of micro volumes

Technical notes

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Measuring baseline-corrected spectra on a Cary 60 UV-Vis

Technical notes

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Low reflectance measurements using the ‘VW’ technique

Technical notes

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Well to well repeatability using a white 96 well microplate

Technical notes

| 2011 | Agilent Technologies

Fluorescence spectroscopy

Instrumentation

Fluorescence spectroscopy

Manufacturer

Agilent Technologies

Industries