Analysis of advanced materials by FD/FI using “AccuTOF GC”
Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Energy & Chemicals
A new method for pesticides identification: fast GC/time-of-flight mass spectrometry
Applications
| 2005 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Qualitative analysis by comprehensive 2D GC / TOFMS - Comparison of kerosene and diesel oil
Applications
| 2005 | JEOL
GCxGC, GC/MSD, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL, ZOEX/JSB
Industries
Energy & Chemicals
Qualitative analysis by comprehensive 2D GC / TOFMS - Analysis of polycyclic aromatic hydrocarbons in kerosene
Applications
| 2005 | JEOL
GCxGC, GC/MSD, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL, ZOEX/JSB
Industries
Energy & Chemicals
Qualitative analysis by comprehensive 2D GC / TOFMS - Analysis of sulfur-contained substances in diesel oil
Applications
| 2005 | JEOL
GCxGC, GC/MSD, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL, ZOEX/JSB
Industries
Energy & Chemicals
Comprehensive 2D GC coupled with JEOL GC-HRTOFMS: GCxGC Applications
Applications
| N/A | JEOL
GCxGC, GC/MSD, Pyrolysis, GC/TOF
Instrumentation
GCxGC, GC/MSD, Pyrolysis, GC/TOF
Manufacturer
JEOL
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Materials Testing, Clinical Research
Accurate mass measurement of lube oil by GC/FI-TOFMS
Applications
| N/A | JEOL
GCxGC, GC/MSD, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Energy & Chemicals
Analysis of photo polymerization initiator in UV light curingadhesives by GC/TOFMS
Applications
| N/A | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Energy & Chemicals
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste