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Applications from Thermo Fisher Scientific - page 58
Total elemental analysis of food samples for routine and research laboratories using the Thermo Scientific iCAP RQ ICP-MS
Applications
| 2017 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Food & Agriculture
Determination of arsenic in food and beverages with pure oxygen reactive gas using the Thermo Scientific iCAP RQ ICP-MS
Applications
| 2017 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Food & Agriculture
Analysis of platinum group metals with the Thermo Scientific iCAP 7400 ICP-OES
Applications
| 2017 | Thermo Fisher Scientific
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Determination of trace elements in steels and alloys using the Thermo Scientific iCAP 7400 ICP-OES
Applications
| 2017 | Thermo Fisher Scientific
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Determination of ultratrace elements in semiconductor grade Isopropyl Alcohol using the Thermo Scientific iCAP RQ ICP-MS
Applications
| 2017 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Lubricating oil analysis according to ASTM D5185 using the Thermo Scientific iCAP 7400 ICP-OES
Applications
| 2017 | Thermo Fisher Scientific
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals
Sprint analysis of lubricating oils using the Thermo Scientific iCAP 7000 Plus Series ICP-OES
Applications
| 2017 | Thermo Fisher Scientific
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals
Routine determination of ultratrace elements in semiconductor grade nitric acid by the Thermo Scientific iCAP RQ ICP-MS
Applications
| 2017 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
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