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The Measure of Purity - Water quality applications
Guides
| 2019 | Agilent Technologies
GC/MSD, GC/MS/MS, HeadSpace, Purge and Trap, GC/SQ, GC/QQQ, Consumables, HPLC, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/QQQ, UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, MP/ICP-AES
Instrumentation
GC/MSD, GC/MS/MS, HeadSpace, Purge and Trap, GC/SQ, GC/QQQ, Consumables, HPLC, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/QQQ, UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, MP/ICP-AES
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Environmental
SPECTROSCOPY SOLUTIONS FOR PHARMACEUTICALS
Others
| 2016 | Agilent Technologies
UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, FTIR Spectroscopy
Instrumentation
UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma
Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Low temperature spectroscopy of a reaction center mutant of Rhodobacter sphaeroidies
Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Clinical Research
Low reflectance measurements using the ‘VW’ technique
Technical notes
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Optical Characterization of Materials Using Spectroscopy
Guides
| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing, Semiconductor Analysis
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Determination of trace amounts of Mercury (II) by Total Fluorescence Quenching using 1,10-phenanthroline and eosin
Applications
| 2012 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Environmental
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike