GCMS
Menu
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike
Language Čeština

Applications focused on GC/MSD - page 6

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis

PYROLYSIS-GC×GC-QTOF FOR THE IMPROVED CHARACTERIZATION OF CRUDE OIL

Posters
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/MS/MS, GC/HRMS, Pyrolysis, GC/Q-TOF
Instrumentation
GCxGC, GC/MSD, GC/MS/MS, GC/HRMS, Pyrolysis, GC/Q-TOF
Manufacturer
Agilent Technologies, CDS Analytical, ZOEX/JSB
Industries
Energy & Chemicals

Detection of Oxygenated Components in Diesel by GCxGC x HR-TOFMS

Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF
Manufacturer
Agilent Technologies, ZOEX/JSB
Industries
Energy & Chemicals

Effectiveness of Fast Scanning Measurement Using GC×GC-MS

Technical notes
| N/A | Shimadzu
GCxGC, GC/MSD, GC/SQ
Instrumentation
GCxGC, GC/MSD, GC/SQ
Manufacturer
Shimadzu, ZOEX/JSB
Industries
Other projects
LCMS
ICPMS
Follow us
FacebookX (Twitter)LinkedInYouTube
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike