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Applications focused on Software - page 82

MIDI Library Plate-grown Anaerobes

Others
| N/A | MIDI
Software
Instrumentation
Software
Manufacturer
MIDI
Industries
Other

MIDI Library Mycobacteria

Others
| N/A | MIDI
Software
Instrumentation
Software
Manufacturer
MIDI
Industries
Other

MIDI Sherlock E-FAME Libraries

Others
| N/A | MIDI
Software
Instrumentation
Software
Manufacturer
MIDI
Industries
Other

Similarity Index Calculation for the Sherlock MIS

Technical notes
| N/A | MIDI
Software
Instrumentation
Software
Manufacturer
MIDI
Industries

MIDI Library Broth-grown Anaerobes

Others
| N/A | MIDI
Software
Instrumentation
Software
Manufacturer
MIDI
Industries

Identification of the additives in polystyrene using the F-Search additive library

Applications
| N/A | Frontier Lab
GC/MSD, Thermal desorption, Software
Instrumentation
GC/MSD, Thermal desorption, Software
Manufacturer
Frontier Lab
Industries
Materials Testing

Using a MS library to differentiate black ballpoint pen inks by Py-GC/MS

Applications
| N/A | Frontier Lab
GC/MSD, Pyrolysis, Software
Instrumentation
GC/MSD, Pyrolysis, Software
Manufacturer
Frontier Lab
Industries
Materials Testing

Identification of an unknown vulcanization accelerator in vulcanized rubber using F-Search and the Additive MS library

Applications
| N/A | Frontier Lab
GC/MSD, Thermal desorption, Software
Instrumentation
GC/MSD, Thermal desorption, Software
Manufacturer
Frontier Lab
Industries
Materials Testing

Frontier Lab F-Search System

Brochures and specifications
| N/A | Frontier Lab
Pyrolysis, Software
Instrumentation
Pyrolysis, Software
Manufacturer
Frontier Lab
Industries

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
Other projects
LCMS
ICPMS
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