The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
Identification of the additives in polystyrene using the F-Search additive library
Applications
| N/A | Frontier Lab
GC/MSD, Thermal desorption, Software
Instrumentation
GC/MSD, Thermal desorption, Software
Manufacturer
Frontier Lab
Industries
Materials Testing
Using a MS library to differentiate black ballpoint pen inks by Py-GC/MS
Applications
| N/A | Frontier Lab
GC/MSD, Pyrolysis, Software
Instrumentation
GC/MSD, Pyrolysis, Software
Manufacturer
Frontier Lab
Industries
Materials Testing
LabSolutions shutdown procedures
Manuals
| N/A | Shimadzu
Software
Instrumentation
Software
Manufacturer
Shimadzu
Industries
A complete solution using GCxGC/MS with GCMS-QP2020 and ChromSquare software