The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste
Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis
Comprehensive 2D GC coupled with JEOL GC-HRTOFMS: GCxGC Applications
Applications
| N/A | JEOL
GCxGC, GC/MSD, Pyrolysis, GC/TOF
Instrumentation
GCxGC, GC/MSD, Pyrolysis, GC/TOF
Manufacturer
JEOL
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Materials Testing, Clinical Research
Accurate mass measurement of lube oil by GC/FI-TOFMS