Applications from the field of Materials Testing - page 21

Overcoming the Challenges Facing the Development and Supply of Advanced Lithographic Materials (Photoresist) for the Semiconductor Industry with ACQUITY UPC2

Applications
| 2012 | Waters
SFC
Instrumentation
SFC
Manufacturer
Waters
Industries
Materials Testing

Isomeric Separations of Cyclometalated Iridium (III) Complexes Using the ACQUITY UPC2 System

Applications
| 2012 | Waters
SFC
Instrumentation
SFC
Manufacturer
Waters
Industries
Materials Testing

Measuring diffuse refl ectance of solid samples with the Agilent Cary 60 UV-Vis

Applications
| 2012 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

Measuring the reflectance of very small samples using the Agilent Cary 60 Remote Diffuse Reflectance Accessory (DRA)

Applications
| 2012 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

SEC-MALS of Silicones

Applications
| 2012 | Wyatt Technology (Waters)
GPC/SEC
Instrumentation
GPC/SEC
Manufacturer
Waters
Industries
Materials Testing

Measuring optical filters

Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

Measuring the cover and shade protection factors of synthetic shadecloth

Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

The determination of thin film thickness using reflectance spectroscopy

Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis

Quantitative analysis of tint in polymer pellets and disks

Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Other projects
LCMS
ICPMS
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