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Applications from the field of Materials Testing focused on GC/TOF - page 4

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis

Py-GC HR-TOF of Circuit Board Polymer

Applications
| N/A | CDS Analytical
GC/MSD, GC/HRMS, Pyrolysis, GC/TOF
Instrumentation
GC/MSD, GC/HRMS, Pyrolysis, GC/TOF
Manufacturer
CDS Analytical, LECO
Industries
Materials Testing
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LCMS
ICPMS
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More information
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike