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Applications from the field of Materials Testing focused on GC/TOF - page 3

Meteorite Analysis by GCxGC-TOFMS

Applications
| 2008 | LECO
GCxGC, GC/MSD, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/TOF
Manufacturer
LECO
Industries
Materials Testing

Analysis of organic EL material by JMS-T100GC “AccuTOF GC” - comparison of FD and DEI methods

Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Materials Testing

Detection of molecular ions from OLED material using AccuTOF GC

Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Materials Testing, Semiconductor Analysis

The power of exact mass measurement: an example of unknown compound identification

Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Materials Testing, Semiconductor Analysis

Comprehensive 2D GC coupled with JEOL GC-HRTOFMS: GCxGC Applications

Applications
| N/A | JEOL
GCxGC, GC/MSD, Pyrolysis, GC/TOF
Instrumentation
GCxGC, GC/MSD, Pyrolysis, GC/TOF
Manufacturer
JEOL
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Materials Testing, Clinical Research

JEOL MS Tips

Guides
| N/A | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Food & Agriculture, Energy & Chemicals , Materials Testing

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications
| N/A | ZOEX/JSB
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Instrumentation
GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software
Manufacturer
JEOL, ZOEX/JSB
Industries
Materials Testing, Semiconductor Analysis

Py-GC HR-TOF of Circuit Board Polymer

Applications
| N/A | CDS Analytical
GC/MSD, GC/HRMS, Pyrolysis, GC/TOF
Instrumentation
GC/MSD, GC/HRMS, Pyrolysis, GC/TOF
Manufacturer
CDS Analytical, LECO
Industries
Materials Testing
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