Applications from the field of Materials Testing focused on GC/TOF - page 3
Meteorite Analysis by GCxGC-TOFMS
Applications
| 2008 | LECO
GCxGC, GC/MSD, GC/TOF
Instrumentation
GCxGC, GC/MSD, GC/TOF
Manufacturer
LECO
Industries
Materials Testing
Analysis of organic EL material by JMS-T100GC “AccuTOF GC” - comparison of FD and DEI methods
Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Materials Testing
Detection of molecular ions from OLED material using AccuTOF GC
Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Materials Testing, Semiconductor Analysis
The power of exact mass measurement: an example of unknown compound identification
Applications
| 2006 | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
Agilent Technologies, JEOL
Industries
Materials Testing, Semiconductor Analysis
Comprehensive 2D GC coupled with JEOL GC-HRTOFMS: GCxGC Applications
Applications
| N/A | JEOL
GCxGC, GC/MSD, Pyrolysis, GC/TOF
Instrumentation
GCxGC, GC/MSD, Pyrolysis, GC/TOF
Manufacturer
JEOL
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Materials Testing, Clinical Research
JEOL MS Tips
Guides
| N/A | JEOL
GC/MSD, GC/TOF
Instrumentation
GC/MSD, GC/TOF
Manufacturer
JEOL
Industries
Food & Agriculture, Energy & Chemicals , Materials Testing
The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste