Applications from the field of Semiconductor Analysis - page 3

Instant, Comprehensive, and Sensitive Airborne Molecular Contaminant (AMC) Analysis Using SIFT-MS

Applications

| 2017 | Syft Technologies

SIFT-MS

Instrumentation

SIFT-MS

Manufacturer

Syft Technologies

Industries

Semiconductor Analysis

AccuTOF GC series Applications Notebook

Applications

| 2016 | JEOL

GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF

Instrumentation

GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF

Manufacturer

Agilent Technologies, JEOL

Industries

Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Other

Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas

Applications

| 2016 | Shimadzu

GC/MSD, Pyrolysis, GC/SQ

Instrumentation

GC/MSD, Pyrolysis, GC/SQ

Manufacturer

Shimadzu, Frontier Lab

Industries

Semiconductor Analysis

Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ

Applications

| 2016 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications

| 2015 | Agilent Technologies

GC, Speciation analysis, ICP/MS/MS

Instrumentation

GC, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications

| 2014 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy

Applications

| 2009 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

The power of exact mass measurement: an example of unknown compound identification

Applications

| 2006 | JEOL

GC/MSD, GC/TOF

Instrumentation

GC/MSD, GC/TOF

Manufacturer

Agilent Technologies, JEOL

Industries

Materials Testing, Semiconductor Analysis

Detection of molecular ions from OLED material using AccuTOF GC

Applications

| 2006 | JEOL

GC/MSD, GC/TOF

Instrumentation

GC/MSD, GC/TOF

Manufacturer

JEOL

Industries

Materials Testing, Semiconductor Analysis